nTelligence™ enables rapid inspection of complex surfaces with processing times three times faster than previous versions.
Nanotronics, developer of the world’s most advanced robotic industrial microscope that combines AI, automation, and sophisticated imaging for industrial inspection, is announcing the release of its fourth generation of artificial intelligence software, nTelligence™.
The new innovations include broad improvements to the nSpec® platform by adding two new AI models with improved performance and increased flexibility. In addition to Nanotronics’ extensive library of analyzers, nTelligence™ adds the ability to not only detect, but classify defects of interest. Nanotronics’ architecture utilizes customized enhancements for deep learning and convolutional networks geared towards sparse data sets. The specialized detection algorithms are tuned for speed and high quality inference from limited training data.
The introduction of Nanotronics’ Gen 4 AI has made processing times that are three times faster than previous models. This approach enables the rapid inspection of complex surfaces without necessitating destructive or expensive analysis methods. “nTelligence™ has enabled our customers to rapidly and robustly detect, classify, and differentiate between nuisance and device-killing defects,” says Sanjay Raveendranath, Director of Product. “When combined with Nanotronics’ illumination modalities, our customers can now identify subtle defects and assign causality to defect propagation in real-time.”
By deploying several different artificial intelligence networks, Nanotronics is building a cohesive platform that will transform every industry while also paving the way for the future of AI factories and further improving manufacturing processes for manufacturing today, and tomorrow. Advancing inspection capabilities in a single tool and software platform is vital for any process that is undergoing radical changes. These additions to our capabilities further reduce manufacturing variations when using multiple metrology tools, while exploring features that have not been analyzed. Nanotronics Vice President of Research and Development, Jonathan Lee, PhD, says, “Use of Nanotronics’ advanced AI techniques allow our customers to maintain quality and optimize complex production processes. Integrated inspection and monitoring throughout the production process allows for increased confidence and accelerates continuous improvement.”
The Gen 4 AI goes beyond salvaging defective products or preventing errors– or even reducing harmful waste and costs. Factory control and production instruments can learn from the process and learn from it in real-time; the result is a single platform that every industry can build from: smaller costs, smaller footprint, more agile.
